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CNMS Capability List

Expand each section below, listed by CNMS research groups, for a quick list of capabilities offered at CNMS. Visit the group pages for more detailed information on each capability.  

See detailed MMA capabilities list HERE

Cameca LEAP 4000X HR Atom Probe Tomography FEI Titan Aberration-corrected S/TEM-EELS JEOL NeoARM Aberration-corrected S/TEM-EELS FEI Titan Krios G4 Cryo-S/TEM TEM Specimen Preparation (FIB, Microtome, Ion Mill, etc.) FEI Nova200 - FIB for APT Sample Prep Nion Hermes (MAC)-STEM/EELS Nion UltraSTEM Aberration-corrected STEM/EELS

See detailed F-AFM capability list HERE

Joule-Thomson STM Omicron AFM AFM with Environmental Control AFM Nanomechanical Properties AFM Nano Electromechanical Properties AFM Dielectric and Conductive Properties AFM Nanoscale Thermal Characterization Fluid FM AFM Advanced Spectroscopies and Workflows AFM Magnetic Properties

See detailed STM capability list HERE

Laser MBE with in situ RHEED, AFM/STM, Electron Spectroscopies Magnetic Property Measurement System Ultra-high Vacuum 4-probe STM Ultra-high Vacuum AFM Low Temperature High Field STM Variable Temperature STM Cryostat STM

For a detailed list of FHN capabilities click HERE

Pulsed Laser Deposition of Thin Films Pulsed Laser Deposition with in situ Diagnostics Auto-PLD Autonomous Synthesis Development Platform Chemical Vapor Deposition Systems for 2D Materials Growth Controlled Atmosphere Glovebox Facility Overview Fully Motorized 2D Transfer System Automated Wire Bonder Confocal Raman Imaging Microscope in Glovebox Maskless Laser Writer Angstrom Engineering Amod Electron Beam/Thermal Evaporator Sonospray Deposition of Nanomaterials and Organics Tunable Low Frequency Raman Spectroscopy Cryo-Optical Spectroscopies Ultra-fast (fs) Pump-Probe Spectroscopy Renishaw Confocal Raman Microscopy and Fluorescence Mapping Systems Fluorometer and Luminescence Spectroscopy System Keyence 3D Surface Profiler Cathodoluminescence SEM Physical Property Measurement System (PPMS) Multifunctional Environmental Chamber Electrochemical (AC and DC) and Optical Characterization Measurement System Q-Sense Pro Gravimetric/Viscoelastic Thin Film Properties Measurement System External Quantum Efficiency Measurement System for Light Emitting Devices External Quantum Efficiency of Photovoltaic Devices Xenocs Xeuss 2.0 & 3.0 Small- and Wide-Angle X-ray Scattering (SAXS/WAXS) System Malvern PANalytical Aeris Benchtop X-ray Diffraction (XRD) System Malvern PANalytical X’Pert Pro MPD High Resolution X-ray Diffraction System Thin Film XRD Operando Raman Spectroscopy Catalysis and Operando IR Spectroscopy Photocatalysis, Electrocatalysis and Plasma Catalysis BET (Volumetric Gas Adsorption Analysis of Surface Area)

For a detailed list of Macro capabilities click HERE

500 MHz Solution NMR Spectroscopy Deuterated Monomer, Polymer, Ionic Liquids, and Specialty Molecule Synthesis Macromolecular Characterization: Molecular Weight, Spectroscopy, Scattering, Thermal Analysis, Broadband Dielectric Spectroscopy MALDI-ToF MS/MS and MALDI-ToF Imaging Polymer Synthesis Surface Initiated Polymerization and/or Surface Functionalization Synthesis of Novel Monomers and Precursors Thin Film Characterization: Ellipsometry, FTIR-ATR, FTIR Microscopy, Contact Angle Goniometer 3D Printing and Additive Manufacturing Capabilities Including SLA, FDM, SLS, DLP Surface Plasmon Resonance Spectroscopy

For a detailed list of NRL capabilities click HERE

Oxford FlexAl Atomic Layer Deposition First Nano Rapid Thermal Processor Tystar Furnace CVD Oxford PECVD Oxford Plasmalab 100 RIE/ICP Reactive Ion Etcher DiamoTek 700-6 Microwave Plasma Diamond CVD Film Deposition Diamond Film Deposition AJA International ATC 2400 Thermionics VE-240 Carbon DC PECVD JEOL 8100 FS Electron Beam Lithography SUSS MicroTech Contact Aligner Heidelberg DW 66 Nanoscribe Pro GT Laser Lithography 3D Direct-Write System Raith Velion Thermo Scientific Helios 5 Hydra UX DualBeam Multiple Ion Plasma FIB/SEM Zeiss Orion NanoFab Helium Ion Microscope Asylum MFP-3D Atomic Force Microscope Phenom XL Scanning Electron Microscope Wyko NT9800 Optical Profilometer LayoutEditor | LayoutEditor Documentation COMSOL, Software for Multiphysics Simulation Lumerical Genisys Beamer Confocal Microscopy Epifluorescent Microscopy Accretech SS10 Dicing Saw SCS PDS2010 Lab Coater 2 Parylene Coating System

For a detailed list of NTI capabilities click HERE

CADES Computational Cluster Frontier Computational Cluster (OLCF) Perlmutter Computational Cluster (NERSC)

For a detailed DNA capability list click HERE

Edge Computing (DGX-2 GPU) CNMS Cloud computing Nodes