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Nanomaterials Characterization

Develops and applies state-of-the-art imaging and spectroscopy methods to understand the structure and function of complex materials in support of the CNMS user program and theme science.

This section encompasses the following research groups:

Functional Atomic Force MicroscopyUnderstands complex interplay between fields and materials at the nanoscale using novel scanning probe imaging and spectroscopy techniques via combined development of state-of-the-art instrumentation, controls, and advanced analysis methods.

Materials MicroÅnalysis Understands materials structure, chemistry, and function by application of analytical and in situ STEM-based methods, including cryo-EM and Atom Probe Microscopy (APT)

Scanning Transmission Electron Microscopy (STEM)Develops and advances new STEM- Scanning Electron Energy Loss Spectroscopy (EELS) techniques and push the spatial, temporal, and energy resolution limits for imaging and spectroscopy.

Scanning Tunneling MicroscopyDevelops novel capabilities to enable unprecedented insight into electronic, magnetic, and transport properties in low-dimensional systems and understand fundamental behavior of quantum systems.



Section Head of Nanomaterials Characterization at the CNMS
Stephen Jesse