Nanomaterials Characterization
The Nanomaterials Characterization Section at CNMS develops and applies state-of-the-art imaging and spectroscopy methods to understand the structure and function of complex materials in support of the CNMS user program and theme science.
It encompasses the following research groups:
Functional Atomic Force Microscopy
Understands complex interplay between fields and materials at the nanoscale using novel scanning probe imaging and spectroscopy techniques via combined development of state-of-the-art instrumentation, controls, and advanced analysis methods.
electron Microscopy and Microanalysis
Understands materials structure, chemistry, and function by application of analytical and in situ STEM-based methods, including cryo-EM and Atom Probe Microscopy (APT).
Develops novel capabilities to enable unprecedented insight into electronic, magnetic, and transport properties in low-dimensional systems and understand fundamental behavior of quantum systems.