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Functional Atomic Force Microscopy

Understands complex interplay between fields and materials at the nanoscale using novel scanning probe imaging and spectroscopy techniques via combined development of state-of-the-art instrumentation, controls, and advanced analysis methods.

Signature Facilities

     Advanced AFM

     Joule-Thomson STM

  • ION-TOF NCS, AFM/FIB-ToF-SIMS consists of a high resolution time-of-flight secondary ion mass spectrometer (TOF-SIMS) including a 30keV BiMn cluster ion gun, 20keV Ar gas cluster source for dual-beam depth profiling and 3D analysis, dual-source O and Cs ion guns for low energy sputtering and thermal ionization and on-axis FIB tomography for very rough samples with a Ga ion source. The FIB-TOF-SIMS/SPM is capable of surface spectroscopy, surface imaging and depth profiling with co-registered in-situ SPM characterization. The coregistered SPM characterization includes non-contact mode analysis using MFM magnetic force microscopy, EFM electrostatic force microscopy, Kelvin probe microscopy; and in contact mode for topography, nanomechanical properties and conductivity.
  • Anasys Instruments NanoIR2-s is equipped with a 4-chip QCL laser and is capable of simultaneously providing AFM topographic imaging with nanometer-scale resolution infrared spectroscopy and IR imaging with sub-100nm spatial resolution, IR-SNOM with sub-20nm resolution. The instrument consists of an atomic force microscope designed for seamless integration with scattering Scanning Near Field Optical Microscopy (s-SNOM) and Atomic Force Microscopy Infrared (AFM-IR) techniques. In addition to nanoscale IR spectroscopy, the instrument can measure contact resonance frequencies of an AFM cantilever using the Lorentz Contact Resonance technique (LCR) in order to map variations in the sample’s mechanical properties; and provide local thermal properties via the nanoTA technique, for quantitative measurements of thermal transition temperatures at nanoscale spatial resolution.