F-AFM Signature Capabilities

Nanomechanical Measurements

Study of nanoscale elastic and plastic properties by stiffness, adhesion and friction force measurements 

Nano Electromechanical Measurements

Piezoresponse Force Microscopy to detect mechanical deformation of materials under bias modulated AFM tips, to study piezoelectricity and ionic motion  

Conductive AFM

Study of local conductive properties and I(V) spectrosctopy by using the AFM tip as a top mobile electrode

Electrostatic and Kelvin Probe Force Microscopy

Measurement of local surface work functions and tip sample electrostatic interactions to study surface charge states

Scanning Microwave Impedance Microscopy

Study of electrical capacitance, dielectric properties and dielectric losses by reflected microwave radiation using the AFM tip as a MW antenna 

Nanoscale Thermal Microscopy

Laser assisted sample heating through AFM tip, to study thermal dependence of functional properties

FluidFM

Fully automated large scanning AFM (DriveAFM, Nanosurf) equipped with hollow microfluidic probes

Glove Box AFM

Control of environmental conditions with AFM in Ar filled glove box

Environmental Controlled AFM

Control of environmental conditions in AFM using an environmental cell for gases and liquids 

Adaptive Band Excitation and Software for SPM

Hardware and software toolbox for multifrequency SPM modes

G-Mode Controller and Software for SPM

Hardware and software toolbox for full signal data acquisition and processing

Scanning Oscillator and Software for SPM

Multifrequency toolbox for synchronous modulation of external fields in SPMs

PyScanner Controller and Software for SPM

Hardware and software toolbox for customized control of SPM operation parameters (scanners and tip motion)

AFM - IR Microscopy

Anasys NanoIR AFM (Bruker) with 4 chip QLC laser for IR absorption spectroscopy in contact resonance mode 

AFM - Raman Microscopy

Integra Spectra II AFM (NT-MDT) combining general purpose AFM with Raman confocal spectrometry

Scanning Near Field Optical Microscopy

AFM Tip induced near field spectroscopy for sub-wavelength resolution

Photoinduced Force Microscopy

Force based detection of optical and IR absorptions and resonances

UHV Scanning Force Microscopy

Variable temperature UHV AFM with optical beam deflection detection for contact and non-contact measurements  

Magnetic Force Microscopy

Study of magnetic nanostructures and nanoscale ferromagnetism

ToF SIMS

ToF.SIMS.5-NSC combining FIB, AFM and time-of-flight secondary ion mass spectrometer (ToF-SIMS) in the same vacuum chamber for correlative functional and chemical characterization