The low-voltage Nion UltraSTEM offers relatively easy atomic resolution Z-contrast images and is ideally suited for thin or 2D samples.
Specifications
- Low-voltage (60-100kV) aberration-corrected STEM/EELS (Nion UltraSTEM)
- Recently equipped with Nion IRIS spectrometer with Dectris ELA detector
- Cold FEG and ultrahigh vacuum column
- Equipped with a fifth order aberration-corrector
- Operation at any voltage between 60 to 100 kV
- 0.1 nm spatial resolution (at 100 kV)
- 300 meV energy resolution for EELS
- Fast SCMOS Camera for 4D-STEM
- Equipped with a holder that enables limited heating and biasing capabilities
