Jordan A Hachtel

R&D Assosciate

Current Research Interests:

I specialize in the use of scanning transmission electron microscopy (STEM) to study the optical, vibrational, and electronic behavior of structures and materials at the nanoscale. Utilizing ultra-high energy resolution monochromated electron energy loss spectroscopy (EELS) I examine infrared excitations in materials such as plasmon and phonons. Additionally, I specialize in using high-speed pixelated detectors and cameras to perform 4D-STEM experiments, capable of imaging the electrostatic fields of materials with atomic-resolution using differential phase contrast. Also, I work on directly integrating advanced numerical and image analysis techniques into the STEM controller software to facilitate efficient acquisition of complex multidimensional datasets. 

Awards

Microanalysis Society Coslett Award - 2019
Center for Nanophase Materials Sciences Postdoctoral Award - 2018
Microscopy Society of America Postdoctoral Research Award - 2018
Springer Publishing Outstanding PhD Thesis Award - 2016
Microscopy Society of America Presidential Scholar Award - 2015