For his pioneering research in atom probe field-ion microscopy and atom probe tomography, most recently to understand the unprecedented properties and behaviors of nanostructured ferritic steels.
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All Corporate Fellow summaries reflect the awardee and ORNL at the time the fellowship was awarded.
2010
2006
For his leadership in light-water reactor development, reactor safety, and the disposition of uranium waste.
For contributions to high-performance networking and multiple-sensor fusion and for developing a unifying theory of information fusion.
2003
For fundamental investigations of the structure and dynamics of materials using X-ray diffraction, including pioneering nanosecond resolution X-ray studies and the development of three-dimensional X-ray structural microscopy with submicron resolution.
For the development of advanced X-ray focusing and microfocusing optics and three-dimensional X-ray microscopy, and for pioneering research on the atomic and mesoscale structure of materials.
For outstanding contributions to the field of applied computer vision research and development that address important national interests in industrial and economic competitiveness, biomedical measurement science, and national security.
2000
For distinguished research on the air/surface exchange of atmospheric trace gases and particles and their interactions with the Earth's biogeochemical cycles, and for pioneering developments in atmospheric sampling methodologies with special emphasis on the global mercury cycle.
1998
For international leadership in developing innovative therapeutic and diagnostic applications of radionuclides for nuclear medicine.
For expertise in developing neutron detection technologies used in scientific research and in nuclear weapon and arms control verification.
1994
For outstanding contributions to many areas of solid-state physics, including the electronic structure of metals, ultrarapid melting and solidification phenomena, pulsed-laser deposition and epitaxial film growth, high-temperature superconductivity, and beam-assisted processing of thin films and superlattices.