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Novocontrol Broadband Dielectric System

Novocontrol broadband dielectric system

The Novocontrol broadband dielectric system provides dielectric, conductivity, and impedance measurements of materials over a wide frequency and temperature ranges.

Science Overview

The ability to characterize the interaction of electromagnetic waves with matter in the frequency range between 10-6 and 1012 Hz is critical for fundamental as well as applied research. Broadband dielectric spectroscopy enables one to gain a wealth of information on the dynamics of bound (dipoles) and mobile charge carriers depending on the details of a molecular system. The Alpha-A Modular Measurement System from Novocontrol for dielectric, conductivity and electrochemical impedance spectroscopy is developed especially for materials research. There is no other commercial analyzer offers comparable accuracy, impedance range and flexibility over a broad frequency range from nearly DC up to the 40 MHz range. These features are crucial for high quality materials characterization. The Novocontrol system can handle both conductive and non-conductive materials and measure up to 1014 W. The temperature control unit allows automated measurements over a broad temperature range (-160°C to 400°C).

Applications

  • Polymers, rubbers, liquid crystals, polar liquids, and ionic liquids
  • Molecular relaxation and dynamics, charge transport in electrolytes
  • Dielectric measurement of low-loss material such as polyethylene
  • Monitoring phase transitions, crystallization processes, and chemical reactions
  • Characterization of semiconductors
  • Colloidal suspensions, biological suspensions, membranes, and composite materials

Specifications

  • Frequency range: 3×10-5 – 4×107 Hz
  • Capacity: 10-15 – 1 F
  • Impedance: 0.01 – 1014 W
  • Loss factor accuracy < 3×10-5, resolution 10-5
  • QUATRO Cryosystem: -160°C to 400°C, with temperature stability 0.01°C
  • A few different sample cells are available, including plate electrodes of different sizes, liquid sample cells, and devices for ultrathin film measurements.