Since 2001, Mike Simpson has been a group leader for the Nanofabrication Research Laboratory and theme leader in the Center for Nanophase Materials Sciences. His research focus includes noise biology, nano-enabled synthetic biology and controlled synthesis and directed assembly of carbon nanostructures.
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All Corporate Fellow summaries reflect the awardee and ORNL at the time the fellowship was awarded.
2014
Jerry is recognized for distinguished research on the genetic basis of tree growth and development, including leading the international efforts to sequence, assemble, and annotate the genomes of poplar and eucalyptus bioenergy feedstocks.
2011
For his role in conceiving, designing, and implementing novel geocomputational methods to help solve a wide variety of national and global problems in energy, the environment, and national security.
For pioneering studies of the functionality of mesoporous oxides and carbons for real-world applications, ionic liquids for chemical separation and materials synthesis, and catalysis by nanomaterials.
2010
For his pioneering research in atom probe field-ion microscopy and atom probe tomography, most recently to understand the unprecedented properties and behaviors of nanostructured ferritic steels.
2009
For far-reaching accomplishments on national security issues relating to nuclear weapons proliferation, security of nuclear materials, and counterterrorism.
For contributions to the methodology for electronic structure calculations and in applications to diverse classes of materials.
2000
For distinguished research on the air/surface exchange of atmospheric trace gases and particles and their interactions with the Earth's biogeochemical cycles, and for pioneering developments in atmospheric sampling methodologies with special emphasis on the global mercury cycle.
1996
For pioneering research in ecosystem theory, ecological modeling, error analysis, hierarchy theory, and landscape ecology and for the development of basic applications in risk assessment and regional environmental analysis.
For development of Z-contrast microscopy, which allows the direct imaging of materials at the atomic scale.