For research that has revolutionized the field of scanning probe microscopy, breaking new ground in atom-scale nanofabrication by combining scanning transmission electron microscopy with artificial intelligence and machine learning methods, and for his representation of ORNL as a fellow in numerous professional societies.
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All Corporate Fellow summaries reflect the awardee and ORNL at the time the fellowship was awarded.
2020
2010
For his pioneering research in atom probe field-ion microscopy and atom probe tomography, most recently to understand the unprecedented properties and behaviors of nanostructured ferritic steels.
2009
For contributions to the methodology for electronic structure calculations and in applications to diverse classes of materials.
2003
For fundamental investigations of the structure and dynamics of materials using X-ray diffraction, including pioneering nanosecond resolution X-ray studies and the development of three-dimensional X-ray structural microscopy with submicron resolution.
For the development of advanced X-ray focusing and microfocusing optics and three-dimensional X-ray microscopy, and for pioneering research on the atomic and mesoscale structure of materials.
For outstanding contributions to the field of applied computer vision research and development that address important national interests in industrial and economic competitiveness, biomedical measurement science, and national security.
1998
For international leadership in developing innovative therapeutic and diagnostic applications of radionuclides for nuclear medicine.
For expertise in developing neutron detection technologies used in scientific research and in nuclear weapon and arms control verification.
1996
For pioneering research in ecosystem theory, ecological modeling, error analysis, hierarchy theory, and landscape ecology and for the development of basic applications in risk assessment and regional environmental analysis.
For development of Z-contrast microscopy, which allows the direct imaging of materials at the atomic scale.