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Scanning Probe Microscopy

The CNMS offers scanning tunneling (STM) and atomic force microscopy (AFM) in a range of environments, along with a wide variety of related spectroscopies, for mapping of physical and electronic structure, electronic and ionic transport, spin, thermovoltage, electromechanics, magnetism, and dissipation.

Signature Facilities

     Advanced AFM

     Joule-Thomson STM

     Low Temperature High Field STM

     NanoTransport System

     Variable Temperature STM

     4-Probe STM

     Cryostat STM


Magnetic Property Measurement System (MPMS)

An MPMS sample magnetometer provides solutions for a unique class of sensitive magnetic measurements in key areas such as high-temperature superconductivity, biochemistry, and magnetic recording media.

  • High homogeneity magnet configurations of ± 7.0 Tesla
  • Continuous Low Temperature Control/Temperature Sweep with Enhanced Thermometry
  • Reciprocating Sample Option (RSO) - DC Magnetization absolute sensitivity: 1 x 10-8 emu @ 2,500 Oe
  • SQUID AC Susceptibility Measurement, 0.1 Hz to 1KHz
  • Horizontal & Vertical Sample Rotators
  • Fiber Optic Sample Holder
  • Magnet Reset
  • Complementary to UHV magneto-optical Kerr effect measurements (UHV-MOKE)