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Researcher
- Rama K Vasudevan
- Ryan Dehoff
- Sergei V Kalinin
- Yongtao Liu
- Kevin M Roccapriore
- Kyle Kelley
- Maxim A Ziatdinov
- Olga S Ovchinnikova
- Andrzej Nycz
- Chris Masuo
- Kashif Nawaz
- Luke Meyer
- Michael Kirka
- Stephen Jesse
- Vincent Paquit
- William Carter
- Adam Stevens
- Ahmed Hassen
- Alexander I Kolesnikov
- Alexei P Sokolov
- Alex Plotkowski
- Alex Walters
- Alice Perrin
- Amir K Ziabari
- Amit Shyam
- An-Ping Li
- Andres Marquez Rossy
- Andrew Lupini
- Anton Ievlev
- Arpan Biswas
- Bekki Mills
- Benjamin Lawrie
- Blane Fillingim
- Bogdan Dryzhakov
- Brian Fricke
- Brian Post
- Bruce Hannan
- Chengyun Hua
- Christopher Ledford
- Christopher Rouleau
- Clay Leach
- Costas Tsouris
- Dave Willis
- David Nuttall
- Debangshu Mukherjee
- Gabor Halasz
- Gerd Duscher
- Gs Jung
- Gyoung Gug Jang
- Hoyeon Jeon
- Huixin (anna) Jiang
- Ilia N Ivanov
- Ivan Vlassiouk
- James Haley
- Jamieson Brechtl
- Jewook Park
- Jiaqiang Yan
- John Wenzel
- Jong K Keum
- Joshua Vaughan
- Kai Li
- Keju An
- Kyle Gluesenkamp
- Liam Collins
- Loren L Funk
- Luke Chapman
- Mahshid Ahmadi-Kalinina
- Mark Loguillo
- Marti Checa Nualart
- Matthew B Stone
- Md Inzamam Ul Haque
- Mina Yoon
- Neus Domingo Marimon
- Nickolay Lavrik
- Ondrej Dyck
- Patxi Fernandez-Zelaia
- Peeyush Nandwana
- Peter Wang
- Petro Maksymovych
- Philip Bingham
- Polad Shikhaliev
- Radu Custelcean
- Rangasayee Kannan
- Roger G Miller
- Saban Hus
- Sai Mani Prudhvi Valleti
- Sarah Graham
- Shannon M Mahurin
- Steven Randolph
- Sudarsanam Babu
- Sumner Harris
- Sydney Murray III
- Tao Hong
- Theodore Visscher
- Tomonori Saito
- Utkarsh Pratiush
- Vasilis Tzoganis
- Vasiliy Morozov
- Venkatakrishnan Singanallur Vaidyanathan
- Victor Fanelli
- Vipin Kumar
- Vladislav N Sedov
- Vlastimil Kunc
- William Peter
- Xiaobing Liu
- Yacouba Diawara
- Yan-Ru Lin
- Ying Yang
- Yukinori Yamamoto
- Yun Liu
- Zhiming Gao

Simurgh revolutionizes industrial CT imaging with AI, enhancing speed and accuracy in nondestructive testing for complex parts, reducing costs.

This invention introduces a system for microscopy called pan-sharpening, enabling the generation of images with both full-spatial and full-spectral resolution without needing to capture the entire dataset, significantly reducing data acquisition time.

An innovative low-cost system for in-situ monitoring of strain and temperature during directed energy deposition.

This innovative approach combines optical and spectral imaging data via machine learning to accurately predict cancer labels directly from tissue images.

This technology introduces an advanced machine learning approach for enhancing chemical imaging by correlating data from two mass spectrometry imaging (MSI) techniques.

A high-strength, heat-resistant Al-Ce-Ni alloy optimized for additive manufacturing in industrial applications.
Aromas play a significant role in the quality and safety of food, beverages, and even manufactured products. The ability to detect and interpret these aromas accurately can enhance product safety and consumer satisfaction.
