The world is full of “huge, gnarly problems,” as ORNL research scientist and musician Melissa Allen-Dumas puts it — no matter what line of work you’re in. That was certainly the case when she would wrestle with a tough piece of music.
A world-leading researcher in solid electrolytes and sophisticated electron microscopy methods received Oak Ridge National Laboratory’s top science honor today for her work in developing new materials for batteries. The announcement was made during a livestreamed Director’s Awards event hosted by ORNL Director Thomas Zacharia.
Ten scientists from the Department of Energy’s Oak Ridge National Laboratory are among the world’s most highly cited researchers, according to a bibliometric analysis conducted by the scientific publication analytics firm Clarivate.
ORNL's Larry Baylor and Andrew Lupini have been elected fellows of the American Physical Society.
An international problem like climate change needs solutions that cross boundaries, both on maps and among disciplines. Oak Ridge National Laboratory computational scientist Deeksha Rastogi embodies that approach.
Sergei Kalinin, a scientist and inventor at the Department of Energy’s Oak Ridge National Laboratory, has been elected a fellow of the Microscopy Society of America professional society.
The Department of Energy’s Oak Ridge National Laboratory has licensed its award-winning artificial intelligence software system, the Multinode Evolutionary Neural Networks for Deep Learning, to General Motors for use in vehicle technology and design.
A multi-institutional team became the first to generate accurate results from materials science simulations on a quantum computer that can be verified with neutron scattering experiments and other practical techniques.
The annual Director's Awards recognized four individuals and teams including awards for leadership in quantum simulation development and application on high-performance computing platforms, and revolutionary advancements in the area of microbial
Researchers at ORNL used quantum optics to advance state-of-the-art microscopy and illuminate a path to detecting material properties with greater sensitivity than is possible with traditional tools.