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Scanning probe microscopes use an atom-sharp tip—only a few nanometers thick—to image materials on a nanometer length scale. The probe tip, invisible to the eye, is attached to a cantilever (pictured) that moves across material surfaces like the tone arm on a record player. Credit: Genevieve Martin/Oak Ridge National Laboratory; U.S. Dept. of Energy.

Liam Collins: Mapping the unseen

Liam Collins was drawn to study physics to understand “hidden things” and honed his expertise in microscopy so that he could bring them to light.

To develop complex materials with superior properties, Vera Bocharova uses diverse methods including broadband dielectric spectroscopy. Credit: Oak Ridge National Laboratory, U.S. Dept. of Energy; photographer Jason Richards

Vera Bocharova: Advancing the frontiers of knowledge about soft materials

Vera Bocharova at the Department of Energy’s Oak Ridge National Laboratory investigates the structure and dynamics of soft materials.

Sergei Kalinin, director of the Institute for Functional Imaging of Materials at Oak Ridge National Laboratory, convenes experts in microscopy and computing to gain scientific insights that will inform design of advanced materials for energy and informati

Sergei Kalinin: Turning seeing into understanding and making

Sergei Kalinin of the Department of Energy’s Oak Ridge National Laboratory knows that seeing something is not the same as understanding it. As director of ORNL’s Institute for Functional Imaging of Materials, he convenes experts in microscopy and computing to gain scientific insigh...