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Researcher
- Rama K Vasudevan
- Ryan Dehoff
- Rafal Wojda
- Sergei V Kalinin
- Yongtao Liu
- Kevin M Roccapriore
- Kyle Kelley
- Maxim A Ziatdinov
- Olga S Ovchinnikova
- Prasad Kandula
- Alex Plotkowski
- Kashif Nawaz
- Michael Kirka
- Stephen Jesse
- Vandana Rallabandi
- Vincent Paquit
- Adam Stevens
- Ahmed Hassen
- Alice Perrin
- Amir K Ziabari
- Amit Shyam
- An-Ping Li
- Andres Marquez Rossy
- Andrew Lupini
- Anton Ievlev
- Arpan Biswas
- Benjamin Lawrie
- Blane Fillingim
- Bogdan Dryzhakov
- Brian Fricke
- Brian Post
- Chengyun Hua
- Christopher Fancher
- Christopher Ledford
- Christopher Rouleau
- Clay Leach
- Costas Tsouris
- David Nuttall
- Debangshu Mukherjee
- Gabor Halasz
- Gerd Duscher
- Gs Jung
- Gyoung Gug Jang
- Hoyeon Jeon
- Huixin (anna) Jiang
- Ilia N Ivanov
- Ivan Vlassiouk
- James Haley
- Jamieson Brechtl
- Jewook Park
- Jiaqiang Yan
- Jong K Keum
- Kai Li
- Kyle Gluesenkamp
- Liam Collins
- Mahshid Ahmadi-Kalinina
- Marcio Magri Kimpara
- Marti Checa Nualart
- Md Inzamam Ul Haque
- Mina Yoon
- Mostak Mohammad
- Neus Domingo Marimon
- Nickolay Lavrik
- Omer Onar
- Ondrej Dyck
- Patxi Fernandez-Zelaia
- Peeyush Nandwana
- Petro Maksymovych
- Philip Bingham
- Praveen Kumar
- Radu Custelcean
- Rangasayee Kannan
- Roger G Miller
- Saban Hus
- Sai Mani Prudhvi Valleti
- Sarah Graham
- Shajjad Chowdhury
- Steven Randolph
- Subho Mukherjee
- Sudarsanam Babu
- Suman Debnath
- Sumner Harris
- Utkarsh Pratiush
- Venkatakrishnan Singanallur Vaidyanathan
- Vipin Kumar
- Vlastimil Kunc
- William Peter
- Xiaobing Liu
- Yan-Ru Lin
- Ying Yang
- Yukinori Yamamoto
- Zhiming Gao

This technology provides a device, platform and method of fabrication of new atomically tailored materials. This “synthescope” is a scanning transmission electron microscope (STEM) transformed into an atomic-scale material manipulation platform.

In scientific research and industrial applications, selecting the most accurate model to describe a relationship between input parameters and target characteristics of experiments is crucial.

This technology combines 3D printing and compression molding to produce high-strength, low-porosity composite articles.

This invention presents technologies for characterizing physical properties of a sample's surface by combining image processing with machine learning techniques.

Simurgh revolutionizes industrial CT imaging with AI, enhancing speed and accuracy in nondestructive testing for complex parts, reducing costs.

This invention introduces a system for microscopy called pan-sharpening, enabling the generation of images with both full-spatial and full-spectral resolution without needing to capture the entire dataset, significantly reducing data acquisition time.

An innovative low-cost system for in-situ monitoring of strain and temperature during directed energy deposition.