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Researcher
- Steve Bullock
- Corson Cramer
- Rama K Vasudevan
- Ryan Dehoff
- Ahmed Hassen
- Sergei V Kalinin
- Vlastimil Kunc
- Yongtao Liu
- Greg Larsen
- James Klett
- Kevin M Roccapriore
- Kyle Kelley
- Maxim A Ziatdinov
- Michael Kirka
- Nadim Hmeidat
- Olga S Ovchinnikova
- Trevor Aguirre
- Christopher Ledford
- David Nuttall
- Kashif Nawaz
- Stephen Jesse
- Steven Guzorek
- Vincent Paquit
- Vipin Kumar
- Adam Stevens
- Alex Plotkowski
- Alice Perrin
- Amir K Ziabari
- Amit Shyam
- An-Ping Li
- Andres Marquez Rossy
- Andrew Lupini
- Anton Ievlev
- Arpan Biswas
- Benjamin Lawrie
- Beth L Armstrong
- Blane Fillingim
- Bogdan Dryzhakov
- Brian Fricke
- Brian Post
- Brittany Rodriguez
- Charlie Cook
- Chengyun Hua
- Christopher Hershey
- Christopher Rouleau
- Clay Leach
- Costas Tsouris
- Craig Blue
- Dan Coughlin
- Daniel Rasmussen
- David J Mitchell
- Debangshu Mukherjee
- Dustin Gilmer
- Gabor Halasz
- Gerd Duscher
- Gs Jung
- Gyoung Gug Jang
- Hoyeon Jeon
- Huixin (anna) Jiang
- Ilia N Ivanov
- Ivan Vlassiouk
- James Haley
- Jamieson Brechtl
- Jewook Park
- Jiaqiang Yan
- John Lindahl
- Jong K Keum
- Jordan Wright
- Kai Li
- Kyle Gluesenkamp
- Liam Collins
- Mahshid Ahmadi-Kalinina
- Marti Checa Nualart
- Md Inzamam Ul Haque
- Mina Yoon
- Neus Domingo Marimon
- Nickolay Lavrik
- Ondrej Dyck
- Patxi Fernandez-Zelaia
- Peeyush Nandwana
- Petro Maksymovych
- Philip Bingham
- Radu Custelcean
- Rangasayee Kannan
- Roger G Miller
- Saban Hus
- Sai Mani Prudhvi Valleti
- Sana Elyas
- Sarah Graham
- Steven Randolph
- Subhabrata Saha
- Sudarsanam Babu
- Sumner Harris
- Tomonori Saito
- Tony Beard
- Tyler Smith
- Utkarsh Pratiush
- Venkatakrishnan Singanallur Vaidyanathan
- William Peter
- Xiaobing Liu
- Yan-Ru Lin
- Ying Yang
- Yukinori Yamamoto
- Zhiming Gao

This invention presents technologies for characterizing physical properties of a sample's surface by combining image processing with machine learning techniques.

Simurgh revolutionizes industrial CT imaging with AI, enhancing speed and accuracy in nondestructive testing for complex parts, reducing costs.

This invention introduces a system for microscopy called pan-sharpening, enabling the generation of images with both full-spatial and full-spectral resolution without needing to capture the entire dataset, significantly reducing data acquisition time.

An innovative low-cost system for in-situ monitoring of strain and temperature during directed energy deposition.

This innovative approach combines optical and spectral imaging data via machine learning to accurately predict cancer labels directly from tissue images.

This technology introduces an advanced machine learning approach for enhancing chemical imaging by correlating data from two mass spectrometry imaging (MSI) techniques.

A high-strength, heat-resistant Al-Ce-Ni alloy optimized for additive manufacturing in industrial applications.

The vast majority of energy conversion technologies and industrial processes depend on heat exchangers for transferring heat between fluids.