Abstract
The safe handling of activated samples requires containment and covering the sample to eliminate any potential for contamination. Subsequent characterization of the surface with x-rays ideally necessitates a thin film. While many films appear visually transparent, they are not necessarily x-ray transparent. Each film material has a unique beam attenuation and sometimes have amorphous peaks that can superimpose with those of the sample. To reconstruct the intensity of the underlying activated sample, the x-ray attenuation and signal due to the film needs to be removed from that of the sample. This requires the calculation of unique deconvolution parameters for the film. The development of a reconstruction procedure for a contained/covered sample is described.
