Publication Type
Journal
Journal Name
Applied Physics Letters
Publication Date
Page Number
192901
Volume
103
Issue
19
Abstract
The influence of an electrically inhomogeneous epitaxial bottom layer on the ferroelectric and
electrical properties has been explored in epitaxial PbTiO3 (PTO)/La0.7Sr0.3MnO3 (LSMO)
submicron structures using atomic force microscopy. The submicron LSMO-dot structures
underneath the ferroelectric PTO film allow exploring gradual changes in material properties. The
LSMO interfacial layer influences significantly both electrical and ferroelectric properties of the
upper PTO layer. The obtained results show that the as-grown polarization state of an epitaxial
ferroelectric layer is strongly influenced by the properties of the layer on top of which it is
deposited.
