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Publication

Beyond NMF: Advanced Signal Processing and Machine Learning Methodologies for Hyperspectral Analysis in EELS

Publication Type
Conference Paper
Journal Name
Microscopy and Microanalysis
Publication Date
Page Numbers
322 to 324
Volume
27
Issue
S1
Conference Name
Microscopy and Microanalysis
Conference Location
Pittsburgh, Pennsylvania, United States of America
Conference Sponsor
TESCAN, JEOL, Hitachi, Zeiss, Ted Pella Inc., Raith Nanofabrication, Ametek, KM Labs, Bruker, Dectris, Nion, HREM Research Inc., Strobe, Protochips, Oxford Instruments, APTech, TTP Lab Tech
Conference Date
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