Scanning Transmission Electron Microscopy

Scanning Transmission Electron Microscopy 

Develops and advances new STEM- Scanning Electron Energy Loss Spectroscopy (EELS) techniques and push the spatial, temporal, and energy resolution limits for imaging and spectroscopy. Capabilities available to users include:

• JEOL NEOARM TEM/STEM

  • Cold FEG
     
  • Operation voltages: 30, 60, 80 and 200 kV
     
  • CEOS probe corrector:
    • 0.078 nm at 200 kV
    • 0.140 nm at 30 kV
       
  • Low dose imaging
     
  • Enhanced ABF detector
     
  • Large-angle SDD detector for EDX
     
  • Integrated LN2 cooling/bias/heating stage
     
  • EELS 965 Quantum ER
    • 330 meV at 300 kV
    • 260 meV at 30 kV
       
  • 4D-Canvas pixelated detector:
    • 1 kfps (256x256), 4kfps (256x64)
    • Single electron sensitivity SNR 300:1 (80 keV)
       

• Low-voltage (60-100kV) aberration-corrected STEM/EELS (Nion UltraSTEM)

  • Cold FEG and ultrahigh vacuum column
     
  • Equipped with a 5^th order aberration-corrector
     
  • Operation at any voltage between 60 to 100 kV
     
  • 0.1 nm maximum spatial resolution (at 100 kV)
     
  • 300 meV energy resolution for EELS
     
  • Fast SCMOS Camera for 4d-STEM
     
  • Equipped with a holder that enables heating & biasing capabilities
     

• Low-voltage (60-100kV) monochromated, aberration-corrected (MAC)-STEM/EELS (Nion Hermes)

  • Cold FEG and ultrahigh vacuum column
     
  • Equipped with next generation 𝛼-monochromator and 5^th Order Aberration-corrector  capable of cutting-edge energy resolution for low-loss EELS while retaining sub-Ångstrom spatial resolution
     
  • 0.1 nm maximum spatial resolution (at 100 kV)
     
  • Fast SCMOS Camera for 4d-STEM
     
  • Equipped with a holder that enables heating & biasing capabilities
     
  • Side entry stage that enables liquid nitrogen cryogenic experiments (summer 2021)
     
  • Energy resolution better than 5 meV, excitations detectable at energies low as 15 meV (80 µm, 120 cm^-1, 3.6 THz), providing access to access to excitations such as phonons, molecular vibrations, and other mid-infrared quasiparticles.
     
  • Aloof excitations capable of gently probing beam sensitive materials such as encapsulated liquids, amino acids, and whole-cell biological samples with nanoscale spatial resolution.
     
  • Off-axis EELS acquisitions suppress delocalized aloof contributions to enable ultrahigh resolution analysis of ultralow energy excitations.
     
  • Q-slit EELS aperture enables 0.5 Å^-1 momentum-resolution while retaining 2-3 nm spatial resolution at maximum monochromation, for fast-efficient phonon dispersion measurements.