Scanning Transmission Electron Microscopy

Scanning Transmission Electron Microscopy 

Develops and advances new STEM- Scanning Electron Energy Loss Spectroscopy (EELS) techniques and push the spatial, temporal, and energy resolution limits for imaging and spectroscopy. Capabilities available to users include:

  • JEOL NEOARM TEM/STEM

    • Cold FEG
       
    • Operation voltages: 30, 60, 80 and 200 kV
       
    • CEOS probe corrector:
      • 0.078 nm at 200 kV
      • 0.140 nm at 30 kV
         
    • Low dose imaging
       
    • Enhanced ABF detector
       
    • Large-angle SDD detector for EDX
       
    • Integrated LN2 cooling/bias/heating stage
       
    • EELS 965 Quantum ER
      • 330 meV at 300 kV
      • 260 meV at 30 kV
         
    • 4D-Canvas pixelated detector:
      • 1 kfps (256x256), 4kfps (256x64)
      • Single electron sensitivity SNR 300:1 (80 keV)
         

  • Low-voltage (60-100kV) aberration-corrected STEM/EELS (Nion UltraSTEM)

    • Cold FEG and ultrahigh vacuum column
       
    • Equipped with a 5th order aberration-corrector
       
    • Operation at any voltage between 60 to 100 kV
       
    • 0.1 nm maximum spatial resolution (at 100 kV)
       
    • 300 meV energy resolution for EELS
       
    • Fast SCMOS Camera for 4d-STEM
       
    • Equipped with a holder that enables heating & biasing capabilities
       

  • Low-voltage (60-100kV) monochromated, aberration-corrected (MAC)-STEM/EELS (Nion Hermes)

    • Cold FEG and ultrahigh vacuum column
       
    • Equipped with next generation 𝛼-monochromator and 5th Order Aberration-corrector  capable of cutting-edge energy resolution for low-loss EELS while retaining sub-Ångstrom spatial resolution
       
    • 0.1 nm maximum spatial resolution (at 100 kV)
       
    • Fast SCMOS Camera for 4d-STEM
       
    • Equipped with a holder that enables heating & biasing capabilities
       
    • Side entry stage that enables liquid nitrogen cryogenic experiments (summer 2021)
       
    • Energy resolution better than 5 meV, excitations detectable at energies low as 15 meV (80 µm, 120 cm-1, 3.6 THz), providing access to access to excitations such as phonons, molecular vibrations, and other mid-infrared quasiparticles.
       
    • Aloof excitations capable of gently probing beam sensitive materials such as encapsulated liquids, amino acids, and whole-cell biological samples with nanoscale spatial resolution.
       
    • Off-axis EELS acquisitions suppress delocalized aloof contributions to enable ultrahigh resolution analysis of ultralow energy excitations.
       
    • Q-slit EELS aperture enables 0.5 Å-1 momentum-resolution while retaining 2-3 nm spatial resolution at maximum monochromation, for fast-efficient phonon dispersion measurements.