Electron Microscopes
Aberration-corrected S/TEM-EELS microscope equipped with a cold-field emission gun, JEOL ASCOR aberration corrector, operating at 30kV, 60kV, 80kV, and 200kV with Gatan Quantum GIF for EELS/EFTEM, dual large solid angle EDS, secondary electron, segmented and pixelated STEM detectors. Specialty holders available for Cryo STEM, tomography, heating and electrical bias experiments.
Ultra-high vacuum, low voltage (60-100kV), aberration-corrected STEM/EELS equipped with a cold-field emission gun, Nion IRIS spectrometer, and Dectris ELA hybrid-pixel detector. Specialty holders available for heating and electrical biasing experiments.
Monochromated aberration-corrected STEM (“MACSTEM”) with a side-entry stage, provides high-vacuum, low voltage (60-100kV), aberration-corrected STEM and monochromated EELS to below 10 meV energy resolution. It is equipped with a cold-field emission gun, Nion IRIS spectrometer, and Dectris ELA hybrid-pixel detector. Specialty holders available for heating, cooling to liquid nitrogen temperatures, and electrical biasing experiments.
Aberration-corrected scanning transmission electron microscope with an “extreme Schottky” high-brightness field emission gun (X-FEG) and variable operating voltages (60 and 300 kV). Equipped with Gatan Quantum GIF for dual-EELS and fast spectrum imaging, One View Camera and STEMx for 4D-STEM experiments, and specialty holders (Cryo, Tomography, Liquid, Gas, Thermal, Electrical Bias).
Focused ion beam (FIB) and mechanical cross-section polishing with ion mill finishing available for a limited number of samples per user project.