Scientist-inventors from ORNL will present seven new technologies during the Technology Innovation Showcase on Friday, July 14, from 8 a.m.–4 p.m. at the Joint Institute for Computational Sciences on ORNL’s campus.
Working with Western Michigan University and other partners, ORNL engineers are placing low-powered sensors in the reflective raised pavement markers that are already used to help drivers identify lanes. Microchips inside the markers transmit information to passing cars about the road shape to help autonomous driving features function even when vehicle cameras or remote laser sensing, called LiDAR, are unreliable because of fog, snow, glare or other obstructions.
ORNL’s Debangshu Mukherjee has been named an npj Computational Materials “Reviewer of the Year.”
The Oak Ridge Leadership Computing Facility’s Matt Sieger has been named the project director for the OLCF-6 effort. This next OLCF undertaking will plan and build a world-class successor to the OLCF’s still-new exascale system, Frontier.
Shih-Chieh Kao, manager of the Water Power program at ORNL, has been named a fellow of the American Society of Civil Engineer’s Environmental & Water Resources Institute, or EWRI.
Colleen Iversen, ecosystem ecologist, group leader and distinguished staff scientist, has been named director of the Next-Generation Ecosystem Experiments Arctic, or NGEE Arctic, a multi-institutional project studying permafrost thaw and other climate-related processes in Alaska.
Computing pioneer Jack Dongarra has been elected to the National Academy of Sciences in recognition of his distinguished and continuing achievements in original research.
SAE International has awarded ORNL Buildings and Transportation Science Division Director Robert Wagner with the SAE Medal of Honor for his dedication and support of the organization’s mission of advancing mobility solutions.
Andrew Lupini, a scientist and inventor at ORNL, has been elected Fellow of the Microscopy Society of America.
Researchers at ORNL have developed a machine-learning inspired software package that provides end-to-end image analysis of electron and scanning probe microscopy images.