ORNL hosted its fourth Artificial Intelligence for Robust Engineering and Science, or AIRES, workshop from April 18-20. Over 100 attendees from government, academia and industry convened to identify research challenges and investment areas, carving the future of the discipline.
Wildfires have shaped the environment for millennia, but they are increasing in frequency, range and intensity in response to a hotter climate. The phenomenon is being incorporated into high-resolution simulations of the Earth’s climate by scientists at the Department of Energy’s Oak Ridge National Laboratory, with a mission to better understand and predict environmental change.
The Spallation Neutron Source at the Department of Energy's Oak Ridge National Laboratory set a world record when its particle accelerator beam operating power reached 1.7 megawatts, substantially improving on the facility’s original design capability.
Researchers at the Department of Energy’s Oak Ridge National Laboratory were the first to use neutron reflectometry to peer inside a working solid-state battery and monitor its electrochemistry.
Ken Herwig's scientific drive crystallized in his youth when he solved a tough algebra word problem in his head while tossing newspapers from his bicycle. He said the joy he felt in that moment as a teenager fueled his determination to conquer mathematical mysteries. And he did.
When opportunity meets talent, great things happen. The laser comb developed at ORNL serves as such an example.
Innovations in artificial intelligence are rapidly shaping our world, from virtual assistants and chatbots to self-driving cars and automated manufacturing.
A study led by researchers at ORNL could uncover new ways to produce more powerful, longer-lasting batteries and memory devices.
A trio of new and improved cosmological simulation codes was unveiled in a series of presentations at the annual April Meeting of the American Physical Society in Minneapolis.
Researchers at ORNL have developed a machine-learning inspired software package that provides end-to-end image analysis of electron and scanning probe microscopy images.