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![Jon Poplawsky of Oak Ridge National Laboratory combines atom probe tomography (revealed by this LEAP 4000XHR instrument) with electron microscopy to characterize the compositions, structures, and functions of materials for energy and information technolog Jon Poplawsky of Oak Ridge National Laboratory combines atom probe tomography (revealed by this LEAP 4000XHR instrument) with electron microscopy to characterize the compositions, structures, and functions of materials for energy and information technolog](/sites/default/files/styles/list_page_thumbnail/public/2018-P09428_0.jpg?itok=rCMBpuR3)
Jon Poplawsky, a materials scientist at the Department of Energy’s Oak Ridge National Laboratory, develops and links advanced characterization techniques that improve our ability to see and understand atomic-scale features of diverse materials