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In scientific research and industrial applications, selecting the most accurate model to describe a relationship between input parameters and target characteristics of experiments is crucial.
This invention presents technologies for characterizing physical properties of a sample's surface by combining image processing with machine learning techniques.
This invention introduces a system for microscopy called pan-sharpening, enabling the generation of images with both full-spatial and full-spectral resolution without needing to capture the entire dataset, significantly reducing data acquisition time.