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Researcher
- Kyle Kelley
- Rama K Vasudevan
- Venugopal K Varma
- Blane Fillingim
- Brian Post
- Lauren Heinrich
- Mahabir Bhandari
- Peeyush Nandwana
- Sergei V Kalinin
- Sudarsanam Babu
- Thomas Feldhausen
- Yousub Lee
- Adam Aaron
- Anton Ievlev
- Bogdan Dryzhakov
- Charles D Ottinger
- Govindarajan Muralidharan
- Kevin M Roccapriore
- Liam Collins
- Marti Checa Nualart
- Maxim A Ziatdinov
- Neus Domingo Marimon
- Olga S Ovchinnikova
- Ramanan Sankaran
- Rose Montgomery
- Stephen Jesse
- Steven Randolph
- Thomas R Muth
- Vimal Ramanuj
- Wenjun Ge
- Yongtao Liu

The invention introduces a novel, customizable method to create, manipulate, and erase polar topological structures in ferroelectric materials using atomic force microscopy.

High coercive fields prevalent in wurtzite ferroelectrics present a significant challenge, as they hinder efficient polarization switching, which is essential for microelectronic applications.

This work seeks to alter the interface condition through thermal history modification, deposition energy density, and interface surface preparation to prevent interface cracking.

Additive manufacturing (AM) enables the incremental buildup of monolithic components with a variety of materials, and material deposition locations.

The traditional window installation process involves many steps. These are becoming even more complex with newer construction requirements such as installation of windows over exterior continuous insulation walls.

Ceramic matrix composites are used in several industries, such as aerospace, for lightweight, high quality and high strength materials. But producing them is time consuming and often low quality.

This invention presents technologies for characterizing physical properties of a sample's surface by combining image processing with machine learning techniques.

The interface gasket for building envelope is designed to enhance the installation of windows and other objects into building openings.

This invention introduces a system for microscopy called pan-sharpening, enabling the generation of images with both full-spatial and full-spectral resolution without needing to capture the entire dataset, significantly reducing data acquisition time.

The need for accurate temperature measurement in critical environments such as nuclear reactors is paramount for safety and efficiency.