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This invention provides a method for differentiating if the cell is failing due to chemical/mechanical factors or due to Li dendrite formation by combing high throughput electronic measurement recording with fast data analysis to monitor the change of battery performance at th

Silicon wafer

This technology provides a device, platform and method of fabrication of new atomically tailored materials. This “synthescope” is a scanning transmission electron microscope (STEM) transformed into an atomic-scale material manipulation platform.

Process optimization

In scientific research and industrial applications, selecting the most accurate model to describe a relationship between input parameters and target characteristics of experiments is crucial.