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Researcher
- Rama K Vasudevan
- Ryan Dehoff
- Sergei V Kalinin
- Yongtao Liu
- Kevin M Roccapriore
- Maxim A Ziatdinov
- Kyle Kelley
- Michael Kirka
- Vincent Paquit
- Adam Stevens
- Ahmed Hassen
- Alex Plotkowski
- Alice Perrin
- Amir K Ziabari
- Amit Shyam
- Andres Marquez Rossy
- Anton Ievlev
- Arpan Biswas
- Blane Fillingim
- Brian Post
- Christopher Ledford
- Clay Leach
- David Nuttall
- Gerd Duscher
- James Haley
- Liam Collins
- Mahshid Ahmadi-Kalinina
- Marti Checa Nualart
- Neus Domingo Marimon
- Olga S Ovchinnikova
- Patxi Fernandez-Zelaia
- Peeyush Nandwana
- Philip Bingham
- Rangasayee Kannan
- Roger G Miller
- Sai Mani Prudhvi Valleti
- Sarah Graham
- Stephen Jesse
- Sudarsanam Babu
- Sumner Harris
- Utkarsh Pratiush
- Venkatakrishnan Singanallur Vaidyanathan
- Vipin Kumar
- Vlastimil Kunc
- William Peter
- Yan-Ru Lin
- Ying Yang
- Yukinori Yamamoto

This invention presents technologies for characterizing physical properties of a sample's surface by combining image processing with machine learning techniques.

Simurgh revolutionizes industrial CT imaging with AI, enhancing speed and accuracy in nondestructive testing for complex parts, reducing costs.

This invention introduces a system for microscopy called pan-sharpening, enabling the generation of images with both full-spatial and full-spectral resolution without needing to capture the entire dataset, significantly reducing data acquisition time.

An innovative low-cost system for in-situ monitoring of strain and temperature during directed energy deposition.

A high-strength, heat-resistant Al-Ce-Ni alloy optimized for additive manufacturing in industrial applications.