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Researcher
- Alex Plotkowski
- Amit Shyam
- Kyle Kelley
- Rama K Vasudevan
- James A Haynes
- Sergei V Kalinin
- Stephen M Killough
- Sumit Bahl
- Alice Perrin
- Andres Marquez Rossy
- Anton Ievlev
- Bogdan Dryzhakov
- Bryan Maldonado Puente
- Corey Cooke
- Diana E Hun
- Gerry Knapp
- Jovid Rakhmonov
- Kevin M Roccapriore
- Liam Collins
- Marti Checa Nualart
- Maxim A Ziatdinov
- Neus Domingo Marimon
- Nicholas Richter
- Nolan Hayes
- Olga S Ovchinnikova
- Peeyush Nandwana
- Peter Wang
- Philip Boudreaux
- Ryan Dehoff
- Ryan Kerekes
- Sally Ghanem
- Stephen Jesse
- Steven Randolph
- Sunyong Kwon
- Ying Yang
- Yongtao Liu

Currently available cast Al alloys are not suitable for various high-performance conductor applications, such as rotor, inverter, windings, busbar, heat exchangers/sinks, etc.

The invented alloys are a new family of Al-Mg alloys. This new family of Al-based alloys demonstrate an excellent ductility (10 ± 2 % elongation) despite the high content of impurities commonly observed in recycled aluminum.

The invention introduces a novel, customizable method to create, manipulate, and erase polar topological structures in ferroelectric materials using atomic force microscopy.

High coercive fields prevalent in wurtzite ferroelectrics present a significant challenge, as they hinder efficient polarization switching, which is essential for microelectronic applications.

This invention utilizes new techniques in machine learning to accelerate the training of ML-based communication receivers.

Current technology for heating, ventilation, and air conditioning (HVAC) and other uses such as vending machines rely on refrigerants that have high global warming potential (GWP).

This invention presents technologies for characterizing physical properties of a sample's surface by combining image processing with machine learning techniques.

Technologies for optimizing prefab retrofit panel installation using a real-time evaluator is described.

This invention introduces a system for microscopy called pan-sharpening, enabling the generation of images with both full-spatial and full-spectral resolution without needing to capture the entire dataset, significantly reducing data acquisition time.