1 - 10 of 11 Results
Currently available cast Al alloys are not suitable for various high-performance conductor applications, such as rotor, inverter, windings, busbar, heat exchangers/sinks, etc.
The invented alloys are a new family of Al-Mg alloys. This new family of Al-based alloys demonstrate an excellent ductility (10 ± 2 % elongation) despite the high content of impurities commonly observed in recycled aluminum.
A pressure burst feature has been designed and demonstrated for relieving potentially hazardous excess pressure within irradiation capsules used in the ORNL High Flux Isotope Reactor (HFIR).
The invention introduces a novel, customizable method to create, manipulate, and erase polar topological structures in ferroelectric materials using atomic force microscopy.
Sintering additives to improve densification and microstructure control of UN provides a facile approach to producing high quality nuclear fuels.
High coercive fields prevalent in wurtzite ferroelectrics present a significant challenge, as they hinder efficient polarization switching, which is essential for microelectronic applications.
The use of Fluidized Bed Chemical Vapor Deposition to coat particles or fibers is inherently slow and capital intensive, as it requires constant modifications to the equipment to account for changes in the characteristics of the substrates to be coated.
This invention presents technologies for characterizing physical properties of a sample's surface by combining image processing with machine learning techniques.
This technology is a strategy for decreasing electromagnetic interference and boosting signal fidelity for low signal-to-noise sensors transmitting over long distances in extreme environments, such as nuclear energy generation applications, particularly for particle detection.
This invention introduces a system for microscopy called pan-sharpening, enabling the generation of images with both full-spatial and full-spectral resolution without needing to capture the entire dataset, significantly reducing data acquisition time.