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ORNL researchers have developed a deep learning-based approach to rapidly perform high-quality reconstructions from sparse X-ray computed tomography measurements.
Often there are major challenges in developing diverse and complex human mobility metrics systematically and quickly.
We have been working to adapt background oriented schlieren (BOS) imaging to directly visualize building leakage, which is fast and easy.
This technology provides a device, platform and method of fabrication of new atomically tailored materials. This “synthescope” is a scanning transmission electron microscope (STEM) transformed into an atomic-scale material manipulation platform.
Simurgh revolutionizes industrial CT imaging with AI, enhancing speed and accuracy in nondestructive testing for complex parts, reducing costs.