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Researcher
- Chris Tyler
- Justin West
- Rama K Vasudevan
- Ritin Mathews
- Sergei V Kalinin
- Yongtao Liu
- Kevin M Roccapriore
- Maxim A Ziatdinov
- David Olvera Trejo
- J.R. R Matheson
- Jaydeep Karandikar
- Kyle Kelley
- Scott Smith
- Akash Jag Prasad
- Anton Ievlev
- Arpan Biswas
- Brian Gibson
- Brian Post
- Calen Kimmell
- Emma Betters
- Gerd Duscher
- Greg Corson
- Jesse Heineman
- John Potter
- Josh B Harbin
- Liam Collins
- Mahshid Ahmadi-Kalinina
- Marti Checa Nualart
- Neus Domingo Marimon
- Olga S Ovchinnikova
- Sai Mani Prudhvi Valleti
- Stephen Jesse
- Sumner Harris
- Tony L Schmitz
- Utkarsh Pratiush
- Vladimir Orlyanchik

Quantifying tool wear is historically challenging task due to variable human interpretation. This capture system will allow for an entire side and the complete end of the cutting tool to be analyzed.

The scanning transmission electron microscope (STEM) provides unprecedented spatial resolution and is critical for many applications, primarily for imaging matter at the atomic and nanoscales and obtaining spectroscopic information at similar length scales.

Complex protective casings and housings are necessary for many applications, including combustion chambers of gas turbines used in aerospace engines. Manufacturing these components from forging and/or casting as a whole is challenging, costly, and time-consuming.

Compliance in a part, work holding, or base plate is beneficial for certain processes, but detrimental for machining and material removal.

In additive manufacturing large stresses are induced in the build plate and part interface. A result of theses stresses are deformations in the build plate and final component.

In scientific research and industrial applications, selecting the most accurate model to describe a relationship between input parameters and target characteristics of experiments is crucial.

This invention presents technologies for characterizing physical properties of a sample's surface by combining image processing with machine learning techniques.

This invention introduces a system for microscopy called pan-sharpening, enabling the generation of images with both full-spatial and full-spectral resolution without needing to capture the entire dataset, significantly reducing data acquisition time.