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Understanding building height is imperative to the overall study of energy efficiency, population distribution, urban morphologies, emergency response, among others. Currently, existing approaches for modelling building height at scale are hindered by two pervasive issues.
We have been working to adapt background oriented schlieren (BOS) imaging to directly visualize building leakage, which is fast and easy.
This technology provides a device, platform and method of fabrication of new atomically tailored materials. This “synthescope” is a scanning transmission electron microscope (STEM) transformed into an atomic-scale material manipulation platform.