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- Rama K Vasudevan
- Sergei V Kalinin
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- Victor Fanelli
- Vilmos Kertesz
- Vincent Paquit
- Xiaohan Yang
- Xiuling Nie
- Zhenglai Shen

The slide-in-plant chamber is a small device compatible for use with microscopes (brightfield, confocal) for visualizing events occurring around or inside the roots of plants in real time over short (hours) or long (days) timeframes without sacrificing the plant.

This invention relates to sensors and more specifically to sensors and methods for measuring greenhouse gas concentration.

The improved Two-Color EGR Probe will be modified to probe two separate cool (transition currently being used) and hot CO2 transitions with significant population at ambient and a high temperature indicative of backflowing residual.

The present invention overcomes many of the limitations of AFM cantilevers by enabling amplification of the detection of forces at the tip over a very wide range of frequencies while at the same time reducing unwanted external effects on cantilever dynamics such as stray elect

This invention is an Atomic Force Microscope (AFM) Fluid Delivery/Electrostatic Spray Cantilever for Liquid Extraction-Based Surface Sampling/Ionization Mass Spectrometry that enables sub-micrometer scale spatial sampling of materials from surfaces with direct transfer of

We conceive a resistively heated probe of appropriate composition with drive electronics suitably configured that can achieved pulsed heating rates of the probe at rates of at least 10^9 deg C/s for thermal desorption of macromolecules intact from surfaces with subsequent

The method of the present invention allows a direct measurement of a temperature gradient between two closely spaced conducting bodies, provided the separation gap is small enough to allow quantum electron tunneling and it is adjustable.

The invention relates to a method for determining the clarity of optically dense, clear, or scattering samples, which include: liquid, colloid, gel, emulsions, viscous and non-viscous, or clear optical components.

The ORNL patented and licensed liquid microjunction surface sapling probe (LMJ-SSP) has limited ability to analyze materials from adsorbant surfaces. Solvent can be lost to the surface surface or analytes moved out from vicinity of probe by solvent flow into surface.

Although temperature measurements on the micro- and nanoscale are greatly challenging, they are vitally important in a large number of technological processes.