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Analytical-Instrumentation

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A novel system for validating intelligent electronic devices (IEDs) in power systems using real-time simulation, reducing costs by eliminating amplifiers.

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The proposed variable gap technique modifies the paralleled plate by allowing for in-situ variation of a thin specimen gap (<0.3 mm) located in a fully sealed containment inside a furnace. The gap variation is measured by a precision variance indicator.

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This invention introduces a system for microscopy called pan-sharpening, enabling the generation of images with both full-spatial and full-spectral resolution without needing to capture the entire dataset, significantly reducing data acquisition time.