As Additive Layer Manufacturing (ALM) becomes pervasive in industry, its applications in safety critical component manufacturing are being explored and adopted. However, ALM's reliance on embedded computing renders it vulnerable to tampering through cyber-attacks. Sensor instrumentation of ALM devices allows for rigorous process and security monitoring, but also results in a massive volume of noisy data for each run. As such, in-situ, near-real-time anomaly detection is very challenging. The ideal algorithm for this context is simple, computationally efficient, minimizes false positives, and is accurate enough to resolve small deviations. In this paper, we present a probabilistic-model-based approach to address this challenge. To test our approach, we analyze current measurements from a polymer composite 3D printer during emulated tampering attacks. Our results show that our approach can consistently and efficiently locate small changes in the presence of substantial operational noise.