For research that has revolutionized the field of scanning probe microscopy, breaking new ground in atom-scale nanofabrication by combining scanning transmission electron microscopy with artificial intelligence and machine learning methods, and for his representation of ORNL as a fellow in numerous professional societies.
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All Corporate Fellow summaries reflect the awardee and ORNL at the time the fellowship was awarded.
2020
2009
For contributions to the methodology for electronic structure calculations and in applications to diverse classes of materials.
2001
For significant contributions and leadership in the processing and properties of materials, particularly intermetallic alloys, which have led to his reputation as one of the world's leading scientists in these areas.
1998
For expertise in developing neutron detection technologies used in scientific research and in nuclear weapon and arms control verification.