Thermal and Electromigration-Induced Strains in Polycrystalline Films and Conductor Lines: X-Ray Microbeam Measurements and A... Conference Paper September, 2006
In-situ neutron difraction measurement of transient temperature and stress fields in a thin plate Conference Paper September, 2006
Growth and characterization of alpha-Cr2O3 thin films prepared by reactive AC magnetron sputtering... Journal September, 2006
Spatially resolved distribution of dislocations and crystallographic tilts in GaN layers grown on Si(111) substrates by maskless cantilever epitaxy Journal September, 2006
Biomimetic Synthesis of Calcium-Deficient Hydroxyapatite in a Natural Hydrogel... Journal September, 2006
In situ investigation on selenization kinetics of Cu-In precursor using time-resolved high temperature x-ray diffraction... Journal September, 2006
Feasibility of thermal strain measurements during quasi-steady state using neutron diffraction Conference Paper September, 2006
X-Ray Microbeam Measurements of Individual Dislocation Cell Elastic Strains in Deformed Single-Crystal Copper... Journal August, 2006
X-ray microbeam measurements of individual dislocation cell elastic strains in deformed single-crystal copper... Journal August, 2006
