Topic:
Invention Reference Number
202405635
QVis is a visual analytics tool that helps uncover temporal and multivariate variations in noise properties of quantum devices. Both human-interactive and semi-automated analytic methods are included to address requirements for visual exploration, thresholding, and clustering techniques. Our application of QVis to real-world scenarios demonstrates the ability to reveal noteworthy patterns in the behavior of the critical characterization metrics.
Contact
To learn more about this technology, email partnerships@ornl.gov or call 865-574-1051.
