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Researcher
- Ali Passian
- Kyle Kelley
- Rama K Vasudevan
- Sergei V Kalinin
- Vincent Paquit
- Akash Jag Prasad
- Anton Ievlev
- Bogdan Dryzhakov
- Calen Kimmell
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- Costas Tsouris
- Harper Jordan
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- Joel Asiamah
- Joel Dawson
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- Liam Collins
- Marti Checa Nualart
- Maxim A Ziatdinov
- Nance Ericson
- Neus Domingo Marimon
- Olga S Ovchinnikova
- Ryan Dehoff
- Srikanth Yoginath
- Stephen Jesse
- Steven Randolph
- Varisara Tansakul
- Vladimir Orlyanchik
- Yongtao Liu
- Zackary Snow

System and method for part porosity monitoring of additively manufactured components using machining
In additive manufacturing, choice of process parameters for a given material and geometry can result in porosities in the build volume, which can result in scrap.

The invention introduces a novel, customizable method to create, manipulate, and erase polar topological structures in ferroelectric materials using atomic force microscopy.

High coercive fields prevalent in wurtzite ferroelectrics present a significant challenge, as they hinder efficient polarization switching, which is essential for microelectronic applications.

Sensing of additive manufacturing processes promises to facilitate detailed quality inspection at scales that have seldom been seen in traditional manufacturing processes.

Technologies directed quantum spectroscopy and imaging with Raman and surface-enhanced Raman scattering are described.

This invention presents technologies for characterizing physical properties of a sample's surface by combining image processing with machine learning techniques.