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Researcher
- Rama K Vasudevan
- Sergei V Kalinin
- Yongtao Liu
- Kevin M Roccapriore
- Maxim A Ziatdinov
- Ali Riza Ekti
- Kyle Kelley
- Raymond Borges Hink
- Vincent Paquit
- Aaron Werth
- Aaron Wilson
- Akash Jag Prasad
- Anton Ievlev
- Arpan Biswas
- Burak Ozpineci
- Calen Kimmell
- Canhai Lai
- Chris Tyler
- Clay Leach
- Costas Tsouris
- Elizabeth Piersall
- Emilio Piesciorovsky
- Emrullah Aydin
- Gary Hahn
- Gerd Duscher
- Isaac Sikkema
- Isabelle Snyder
- James Haley
- James Parks II
- Jaydeep Karandikar
- Joseph Olatt
- Kunal Mondal
- Liam Collins
- Mahim Mathur
- Mahshid Ahmadi-Kalinina
- Marti Checa Nualart
- Mingyan Li
- Mostak Mohammad
- Neus Domingo Marimon
- Nils Stenvig
- Olga S Ovchinnikova
- Omer Onar
- Oscar Martinez
- Ozgur Alaca
- Peter L Fuhr
- Ryan Dehoff
- Sai Mani Prudhvi Valleti
- Sam Hollifield
- Stephen Jesse
- Sumner Harris
- Utkarsh Pratiush
- Vladimir Orlyanchik
- Yarom Polsky
- Zackary Snow

Dual-GP addresses limitations in traditional GPBO-driven autonomous experimentation by incorporating an additional surrogate observer and allowing human oversight, this technique improves optimization efficiency via data quality assessment and adaptability to unanticipated exp

This technology can help to increase number of application areas of Wireless Power Transfer systems. It can be applied to consumer electronics, defense industry, automotive industry etc.

System and method for part porosity monitoring of additively manufactured components using machining
In additive manufacturing, choice of process parameters for a given material and geometry can result in porosities in the build volume, which can result in scrap.

The invention introduces a novel, customizable method to create, manipulate, and erase polar topological structures in ferroelectric materials using atomic force microscopy.

Faults in the power grid cause many problems that can result in catastrophic failures. Real-time fault detection in the power grid system is crucial to sustain the power systems' reliability, stability, and quality.

Scanning transmission electron microscopes are useful for a variety of applications. Atomic defects in materials are critical for areas such as quantum photonics, magnetic storage, and catalysis.

Sensing of additive manufacturing processes promises to facilitate detailed quality inspection at scales that have seldom been seen in traditional manufacturing processes.

A human-in-the-loop machine learning (hML) technology potentially enhances experimental workflows by integrating human expertise with AI automation.

The scanning transmission electron microscope (STEM) provides unprecedented spatial resolution and is critical for many applications, primarily for imaging matter at the atomic and nanoscales and obtaining spectroscopic information at similar length scales.

Electrical utility substations are wired with intelligent electronic devices (IEDs), such as protective relays, power meters, and communication switches.