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We have been working to adapt background oriented schlieren (BOS) imaging to directly visualize building leakage, which is fast and easy.
Distortion in scanning tunneling microscope (STM) images is an unavoidable problem. This technology is an algorithm to identify and correct distorted wavefronts in atomic resolution STM images.
Through the use of splicing methods, joining two different fiber types in the tow stage of the process enables great benefits to the strength of the material change.