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ORNL researchers have developed a deep learning-based approach to rapidly perform high-quality reconstructions from sparse X-ray computed tomography measurements.
We have been working to adapt background oriented schlieren (BOS) imaging to directly visualize building leakage, which is fast and easy.
Distortion in scanning tunneling microscope (STM) images is an unavoidable problem. This technology is an algorithm to identify and correct distorted wavefronts in atomic resolution STM images.
Technologies directed quantum spectroscopy and imaging with Raman and surface-enhanced Raman scattering are described.
Simurgh revolutionizes industrial CT imaging with AI, enhancing speed and accuracy in nondestructive testing for complex parts, reducing costs.