For research that has revolutionized the field of scanning probe microscopy, breaking new ground in atom-scale nanofabrication by combining scanning transmission electron microscopy with artificial intelligence and machine learning methods, and for his representation of ORNL as a fellow in numerous professional societies.
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All Corporate Fellow summaries reflect the awardee and ORNL at the time the fellowship was awarded.
2020
2009
For contributions to the methodology for electronic structure calculations and in applications to diverse classes of materials.
2008
For outstanding scientific, programmatic, and institutional contributions to ORNL in advanced computational structural mechanics and nuclear safety technologies.
1998
For expertise in developing neutron detection technologies used in scientific research and in nuclear weapon and arms control verification.