For research that has revolutionized the field of scanning probe microscopy, breaking new ground in atom-scale nanofabrication by combining scanning transmission electron microscopy with artificial intelligence and machine learning methods, and for his representation of ORNL as a fellow in numerous professional societies.
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All Corporate Fellow summaries reflect the awardee and ORNL at the time the fellowship was awarded.
2020
2009
For contributions to the methodology for electronic structure calculations and in applications to diverse classes of materials.
2003
For outstanding contributions to the field of applied computer vision research and development that address important national interests in industrial and economic competitiveness, biomedical measurement science, and national security.
1988
For fundamental contributions to many areas of theoretical solid-state physics that directly relate to experimental programs, including the electronic structure and magnetism of transition and rare-earth metals, metal-electrolyte interfaces, superconductivity, and physical properties of heavy fermion, mixed valent, and fractal materials