For fundamental investigations of the structure and dynamics of materials using X-ray diffraction, including pioneering nanosecond resolution X-ray studies and the development of three-dimensional X-ray structural microscopy with submicron resolution.
Filter Corporate Fellows
Corporate Fellow Type
Year
- (-) 2003 (3)
- (-) 1990 (1)
- (-) 1987 (1)
- 2023 (4)
- 2022 (3)
- 2021 (2)
- 2020 (5)
- 2017 (2)
- 2016 (3)
- 2015 (3)
- 2014 (2)
- 2013 (3)
- 2012 (2)
- 2011 (2)
- 2010 (1)
- 2009 (2)
- 2008 (3)
- 2007 (2)
- 2006 (2)
- 2005 (3)
- 2004 (2)
- 2002 (3)
- 2001 (2)
- 2000 (1)
- 1999 (3)
- 1998 (2)
- 1997 (2)
- 1996 (3)
- 1994 (2)
- 1992 (2)
- 1991 (1)
- 1989 (1)
- 1988 (2)
- 1986 (1)
- 1985 (3)
- 1983 (2)
- 1979 (5)
- 1976 (2)
All Corporate Fellow summaries reflect the awardee and ORNL at the time the fellowship was awarded.
2003
For the development of advanced X-ray focusing and microfocusing optics and three-dimensional X-ray microscopy, and for pioneering research on the atomic and mesoscale structure of materials.
For outstanding contributions to the field of applied computer vision research and development that address important national interests in industrial and economic competitiveness, biomedical measurement science, and national security.
1990
For fundamental studies of the microscopic structure of magnetic materials using neutron scattering methods, and for contributing to the development of neutron polarization analysis as a productive scientific technique.
1987
For fundamental studies in radiation physics and dosimetry, in research to link the basic physics and chemistry of biological molecules irradiated in aqueous solution, and the physicochemical characterization of chemical pollutants