Corporate Fellows

For fundamental investigations of the structure and dynamics of materials using X-ray diffraction, including pioneering nanosecond resolution X-ray studies and the development of three-dimensional X-ray structural microscopy with submicron resolution.

For the development of advanced X-ray focusing and microfocusing optics and three-dimensional X-ray microscopy, and for pioneering research on the atomic and mesoscale structure of materials.

For outstanding contributions to the field of applied computer vision research and development that address important national interests in industrial and economic competitiveness, biomedical measurement science, and national security.