Abstract
In this report, surface characterization and analysis of the of graphite collection and strike plates was conducted. These plates were from an EMIS collector, which had been irradiated with an Yb ion beam. Here in the results of this study are reported along with analysis and discussion of the potential growth mechanism of the Yb layer on graphite. It’s proposed that directional deposition of Yb ions occurs first in the defect regions of the graphite plate. Thus, as deposition continues, this leads to the eventual formation of directional globs which elongated and grew into plates, then stacks and finally into sheets of Yb. The Yb layer appears to be definite with no observable interfacial layer with the graphite. It was also determined that during irradiation with Yb ion beam, that sputtered carbon becomes interpolated in Yb surface layer on the graphite plate and has an amorphous microstructure.
