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Resistivity, carrier trapping, and polarization phenomenon in semiconductor radiation detection materials ...

by Koushik Biswas, Maohua Du, David J Singh
Publication Type
Conference Paper
Journal Name
Proceedings of SPIE
Publication Date
Volume
8507
Conference Name
SPIE 2012 Oprics+Photonics
Conference Location
San Diego, California, United States of America
Conference Date
-