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Publication

Mapping pm-scale Lattice Distortions and Measuring Interlayer Separations in Stacked 2D Materials by Interferometric 4D-STEM...

Publication Type
Conference Paper
Journal Name
Microscopy and Microanalysis
Publication Date
Page Numbers
1752 to 1754
Volume
28
Issue
S1
Conference Name
Microscopy and Microanalysis 2022
Conference Location
Portland, Oregon, United States of America
Conference Sponsor
Microscopy Society of America/Microanalysis Society
Conference Date
-
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